Video
Non-contact 3D Topography Measurement of Solar Cells with the NEMESIS system from Precitec Optronik GmbH
High accuracy 3D topography measurement with just a light beam. This video shows a 3D topography measurement of a solar cell conductor (finger). The used system is the NEMESIS VVX scanning system from Precitec Optronik GmbH in Germany. The used optical sensor is the chromatic white-light sensor CHRocodile E. The accuracy of this surface measurement is 100 nm. More information under: www.precitec-optronik.de This system can also measure the thickness of wafers and solar cells from one side without contact.