Micro Drilling Inspection at IPG's Metrology Lab

At IPG for inspection and measurement of the parts that are laser processed, we optical microscopy, scanning electron microscopy, and atomic force microscopy. Which one you use depends on the part that you’re machining or the feature that you’re trying to analyze. For example, if you want to look at parts using magnifications up to 1000x we would most likely use optical microscopy. Above that, you’ll use scanning electron microscopy or atomic force microscopy, depending on what you’re looking for. For example, SEM is used for high depth of focus on the samples and you want to check parts in depth. In this example, the team inspects microvias that were drilled into a silicon nitride ceramic with an IPG custom inspection tool. This is built on an IX series platform. The applications engineer is inspecting for positional accuracy as well as the height and width of the rectangular microvias. To learn more about IPG’s applications lab abilities or to send us your most challenging samples, please visit our website: https://www.ipgphotonics.com/en/applications/application-center